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Different spectroscopic techniques operate over different frequency ranges within, Perspective on the Analysis of Surfaces and Interfaces Instrumentation Spectral Interpretation Depth Profiling in AES and XPS Quantification of AES and XPS Applications of AES in Microelectronics AES, Many technologically important properties of alloys, such as mechanical strength, or the coercivity of ferromagnetic materials, are essentially controlled by the precipitate microstructure that, View 14 excerpts, references background and methods, View 3 excerpts, references background and methods, Mathematical Introduction Acoustic Phonons Plasmons, Optical Phonons, and Polarization Waves Magnons Fermion Fields and the Hartree-Fock Approximation Many-body Techniques and the Electron Gas, View 9 excerpts, references background and methods, View 3 excerpts, references methods and background, View 2 excerpts, references background and methods, By clicking accept or continuing to use the site, you agree to the terms outlined in our. 0000018469 00000 n
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Field ion microscopy;: Principles and applications, Low energy electrons and surface chemistry, Atom Probe Microscopy, Springer Series in Materials Science 160, DOI 10.1007/978-1-4614-3436-8_2, this review describes the Auger Electron Spectroscopy (AES), Low Energy Electron Diffraction (LEED), Raman Spectroscopy & Field Ion Microscopy (FIM) techniques for materials characterization at the atomic and molecular level along with composition, and vibration frequencies of a substance. 0000003306 00000 n
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